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Digital Signal Integrity Brian Young

Digital Signal Integrity By Brian Young

Digital Signal Integrity by Brian Young


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Summary

Designed for advanced courses in digital design, this book provides techniques for predicting and achieving target performance levels. It gives students the theory, practice, general signal integrity issues, and experimental techniques they need to accurately model and simulate those interconnections and predict real-world performance.

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Digital Signal Integrity Summary

Digital Signal Integrity: Modeling and Simulation with Interconnects and Packages by Brian Young

For advanced courses in digital design.

This state-of-the-art book provides students with techniques for predicting and achieving target performance levels. Gives students all the theory, practice, general signal integrity issues, and leading-edge experimental techniques they need to accurately model and simulate those interconnections and predict real-world performance.

About Brian Young

BRIAN YOUNG is a Member of the Technical Staff at the Somerset Design Center, Semiconductor Product Sector, Motorola, working on packaging, interconnects, and I/O design for PowerPC microprocessors and the RapidIO Interconnect Architecture. For over seven years he has specialized in simulation, modeling, measurement, and performance studies for high-speed signaling with microprocessors, fast static RAMs, and DSPs. He has served as an Assistant Professor in the Department of Electrical Engineering at Texas A&M University, College Station, and as an adjunct professor in the Department of Electrical Engineering at the University of Texas, Austin. Dr. Young holds a Ph.D from the University of Texas, Austin and holds six patents related to packaging. He has published numerous articles in conferences and journals.

Table of Contents



1. Digital Systems and Signaling.

Tradeoffs for Performance Enhancement. Signaling Standards and Logic Families. Interconnects. Modeling of Digital Systems.



2. Signal Integrity.

Transmission Lines. Ideal Point-to-Point Signaling. Nonideal Signaling. Discontinuities. Crosstalk. Topology. Simultaneous Switching Noise. System Timing. Exercises.



3. Simultaneous Switching Noise.

Origins of SSN. Effective Inductance. Off-Chip SSN Dependencies. SSN-Induced Skew. Fast Simulation of Banks. Exercises.



4. Multiport Circuits.

Z-and Y-Parameters. S-Parameters. Multiport Conversions Between S-, Y-, and Z-Parameters. Normalization of S-Parameters. Matrix Reductions. Exercises.



5. Inductance.

Summary of an Electromagnetic Result. Definitions of Inductance. Definition of Mutual Inductance. Calculations with Neumann's Formula. Definition of Partial Inductance. Formulas for Partial Self- and Mutual Inductance. Circuit Symbols. Modal Decomposition. Nonuniqueness of Partial Inductance. Open Loop Modeling. Manipulating the Reference Lead. Model Reduction. Exercises.



6. Capacitance.

Definition of Capacitance. Capacitance between Several Conductors. Energy Definition of Capacitance. Frequency Dependence. Circuit Equations with Capacitance. Modal Decomposition and Passivity. Reference and Capacitance. Model Reduction. Exercises.



7. Resistance.

Skin Effect. Current Crowding. PEEC Method. Ladder Networks. Transresistance. Exercises.



8. Measurement of Parasitics.

Measurement Counts. Impedance Analyzer. Vector Network Analyzer. Time-Domain Reflectometer. Tradeoffs. Exercises.



9. Lumped Modeling.

Transmission Line Introduction. Multiconductor Modeling with Two Samples. Multiconductor Modeling with One Sample. Internal Nodes. Frequency Dependence. Iterative Impedance and Bandwidth. Model Reduction. Approaches for Specific Interconnects. General Topology. Multidrop Nets. Exercises.



10. Wideband Modeling.

Transmission Line Lumped Modeling. Coupled Transmission Lines. Skin Effect Models. Black Box Modeling. Exercises.



11. Enhancing Signal Integrity.

Differential Signaling. Termination. Multiconductor Termination. Power Distribution. Advanced Packaging. Exercises.



Appendix A: Solutions to Selected Problems.


Appendix B: Coaxial Peec Calculator.


Appendix C: Sample Spice SSN Simulations.


Appendix D: Sample Modal Decomposition Code.


Appendix E: Sample Layer Peeling Code.


Index.


About the Author.

Additional information

CIN0130289043G
9780130289049
0130289043
Digital Signal Integrity: Modeling and Simulation with Interconnects and Packages by Brian Young
Used - Good
Hardback
Pearson Education Limited
20001019
560
N/A
Book picture is for illustrative purposes only, actual binding, cover or edition may vary.
This is a used book - there is no escaping the fact it has been read by someone else and it will show signs of wear and previous use. Overall we expect it to be in good condition, but if you are not entirely satisfied please get in touch with us

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