Name: Electron Microscopy of Interfaces in Metals and Alloys von C.T Forwood (CSIRO Manufacturing Science and Technology, Australia)
SKU: 9780750301169
Price: 38.99 EUR
Availability: InStock

Electron Microscopy of Interfaces in Metals and Alloys Zusammenfassung

Electron Microscopy of Interfaces in Metals and Alloys C.T Forwood (CSIRO Manufacturing Science and Technology, Australia)

Electron Microscopy of Interfaces in Metals and Alloys examines the structure of interfaces in metals and alloys using transmission electron microscopy. The book presents quantitative methods of analysis and reviews the most significant work on interface structure over the last 20 years. It provides the first book description of the methods used for quantitative identification of Burgers vectors of interfacial dislocations, including the geometric analysis of periodicities in interface structure and the comparison of experimental and theoretical electron micrographs. The book explores low- and high-angle grain boundaries and interphase interfaces between neighboring grains, emphasizing interfacial dislocations and rigid-body displacements to the structure and properties of interfaces. It also analyzes the use of two-beam images and diffraction patterns for analysis and studies n-beam lattice imaging. The book includes numerous worked examples of the analysis of the structure of grain boundaries and interphase interfaces, which are particularly useful to those who need to consider the nature of intercrystalline interfaces.

Electron Microscopy of Interfaces in Metals and Alloys Bewertungen

" extremely well written easy-to-read description of the microscope conditions that best reveal the structure of the grain boundary and the methods used to analyze the images excellent style of writing makes it easy and enjoyable to read An important part is the detailed description of examples which will make it an invaluable aid to those starting in the field. For those in the field it provides an excellent account of the methods that have been used by the authors to identify the Burgers vector of interfacial dislocations provides a review of the work that has been done on understanding the properties of grain boundaries the authors' considerable contribution to the field."
-I.M. Robertson, Microscopy Research and Technique, 4, 10, 1993

" clearly written and abundantly illustrated "
-P.W. Hawkes, Ultramicroscopy, 50, 111, 1993

" a book one can recommend to anybody working on interface and grain boundary structures. A lot of the techniques mentioned not only hold for alloys but also for semiconductors and ceramics The work treated is very impressive, very well presented, and perfectly illustrated should be on the desk of any materials science electron microscopist working on alloys and dealing with dislocation and grain boundary problems. Any laboratory carrying out electron microscopy in materials science should have a copy "
-G. Van Tendeloo, Advanced Materials, 4, 10, 1994

Über C.T Forwood (CSIRO Manufacturing Science and Technology, Australia)

C.T Forwood (CSIRO Manufacturing Science and Technology, Australia)

Inhaltsverzeichnis

Dislocation theory of interfaces; Image formation and diffraction effects in the electron microscopy of interfaces; Determination of crystallographic and diffraction parameters; Low-angle grain boundaries; High- angle grain boundaries; Some properties of high-angle grain boundaries; Interphase interfaces.

Zusätzliche Informationen

Sku

GOR013755370

ISBN 13

9780750301169

ISBN 10

0750301163

Titel

Electron Microscopy of Interfaces in Metals and Alloys C.T Forwood (CSIRO Manufacturing Science and Technology, Australia)

Autor

C.T Forwood (CSIRO Manufacturing Science and Technology, Australia)

Serien

Series in Microscopy in Materials Science

Zustand

Gebraucht - Wie Neu

Bindung

Gebundene Ausgabe

Verlag

Taylor & Francis Ltd

Datum

1991-01-01

Anzahl der Seiten

434

Preise

N/A

Begleitschreiben

Die Abbildung des Buches dient nur Illustrationszwecken, die tatsächliche Bindung, das Cover und die Auflage können sich davon unterscheiden.

Hinweis

Das Buch wurde gelesen, ist aber in gutem Zustand. Alle Seiten sind intakt, der Einband ist unversehrt. Leichte Gebrauchsspuren am Buchrücken. Das Buch wurde gelesen, sieht jedoch noch wie neu aus. Der Bucheinband weist keine sichtbaren Gebrauchsspuren auf. Gegebenenfalls ist auch ein Schutzumschlag verfügbar. Keine fehlenden oder beschädigten Seiten, keine Risse, eventuell minimale Knicke, keine unterstrichenen oder markierten Textstellen, keine beschrifteten Ränder.