Advances in X-Ray Analysis Charles S. Barrett

Name: Advances in X-Ray Analysis By Charles S. Barrett
SKU: 9780306442490
Price: 258.19 AUD
Availability: InStock

Advances in X-Ray Analysis by Charles S. Barrett

Reviews:

$258.19

Condition - New

Only 2 left

New

Advances in X-Ray Analysis Summary

Advances in X-Ray Analysis: v. 35: Proceedings of Combined First Pacific-International Conference on X-Ray Analytical Methods and Fortieth Annual Conference on Applications of X-Ray Analysis Held in Hilo and Honolulu, Hawaii, August 7-16, 1991 by Charles S. Barrett

Unfortunately we do not have a summary for this item at the moment

Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index.

Additional information

Sku

NPB9780306442490

ISBN 13

9780306442490

ISBN 10

0306442493

Title

Advances in X-Ray Analysis: v. 35: Proceedings of Combined First Pacific-International Conference on X-Ray Analytical Methods and Fortieth Annual Conference on Applications of X-Ray Analysis Held in Hilo and Honolulu, Hawaii, August 7-16, 1991 by Charles S. Barrett

Author

Charles S. Barrett

Condition

New

Binding type

Hardback

Publisher

Springer Science+Business Media

Year published

1992-10-01

Number of pages

1334

Prizes

N/A

Cover note

Book picture is for illustrative purposes only, actual binding, cover or edition may vary.

Note

This is a new book - be the first to read this copy. With untouched pages and a perfect binding, your brand new copy is ready to be opened for the first time

Advances in X-Ray Analysis Charles S. Barrett

Advances in X-Ray Analysis by Charles S. Barrett

Advances in X-Ray Analysis Summary

Advances in X-Ray Analysis: v. 35: Proceedings of Combined First Pacific-International Conference on X-Ray Analytical Methods and Fortieth Annual Conference on Applications of X-Ray Analysis Held in Hilo and Honolulu, Hawaii, August 7-16, 1991 by Charles S. Barrett

Table of Contents

Additional information

Customer Reviews - Advances in X-Ray Analysis