Name: Reliability and Failure of Electronic Materials and Devices By Milton Ohring (Stevens Institute of Technology, Hoboken, NJ, USA (Retired))
SKU: 9780120885749
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Reliability and Failure of Electronic Materials and Devices Summary

Reliability and Failure of Electronic Materials and Devices by Milton Ohring (Stevens Institute of Technology, Hoboken, NJ, USA (Retired))

Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus on statistically predicting failure and product yields, this book can help the design engineer, manufacturing engineer, and quality control engineer all better understand the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects, and radiation damage. This new edition adds cutting-edge knowledge gained both in research labs and on the manufacturing floor, with new sections on plastics and other new packaging materials, new testing procedures, and new coverage of MEMS devices.

About Milton Ohring (Stevens Institute of Technology, Hoboken, NJ, USA (Retired))

Dr. Milton Ohring, author of two previously acclaimed Academic Press books,The Materials Science of Thin Films (l992) and Engineering Materials Science (1995), has taught courses on reliability and failure in electronics at Bell Laboratories (AT&T and Lucent Technologies). From this perspective and the well-written tutorial style of the book, the reader will gain a deeper physical understanding of failure mechanisms in electronic materials and devices; acquire skills in the mathematical handling of reliability data; and better appreciate future technology trends and the reliability issues they raise. In 1988, Dr Lucian Kasprzak became an IEEE Fellow For contributions to very-largescale-integrated devices through the integration of reliability physics with process development. He discovered the hot-electron effect in short channel field-effect transistors, while at IBM in 1973. From 1992 to 1996, he was Associate Professor of Physics and Engineering Science at Franciscan University. He retired from IBM in 1995 after 30 years. In 1996, he joined Sterling Diagnostic Imaging as Reliability Manager for the Direct Radiography Program. He became Director of Reliability at Direct Radiography Corp. in 1997. Early in 2001 he became an independent Reliability Consultant.

1. An Overview of Electronic Devices and Their Reliability 2. Electronic Devices: Materials Properties Determine How They Operate and Are Fabricated 3. Defects, Contamination and Yield 4. The Mathematics of Failure and Reliability 5. Mass Transport-Induced Failure 6. Electronic Charge-Induced Damage 7. Environmental Damage to Electronic Products 8. Packaging Materials, Processes, and Stresses 9. Degradation of Contacts and Packages 10. Degradation and Failure of Electro-Optical and Magnetic Materials and Devices 11. Characterization and Failure Analysis of Material, Devices and Packages 12. Future Directions and Reliability Issues

Additional information

Sku

NPB9780120885749

ISBN 13

9780120885749

ISBN 10

0120885743

Title

Reliability and Failure of Electronic Materials and Devices by Milton Ohring (Stevens Institute of Technology, Hoboken, NJ, USA (Retired))

Author

Milton Ohring (Stevens Institute of Technology, Hoboken, NJ, USA (Retired))

Condition

New

Binding type

Hardback

Publisher

Elsevier Science Publishing Co Inc

Year published

2014-10-23

Number of pages

758

Prizes

N/A

Cover note

Book picture is for illustrative purposes only, actual binding, cover or edition may vary.

Note

This is a new book - be the first to read this copy. With untouched pages and a perfect binding, your brand new copy is ready to be opened for the first time

Reliability and Failure of Electronic Materials and Devices Milton Ohring (Stevens Institute of Technology, Hoboken, NJ, USA (Retired))

Reliability and Failure of Electronic Materials and Devices by Milton Ohring (Stevens Institute of Technology, Hoboken, NJ, USA (Retired))

Summary

Reliability and Failure of Electronic Materials and Devices Summary

Reliability and Failure of Electronic Materials and Devices by Milton Ohring (Stevens Institute of Technology, Hoboken, NJ, USA (Retired))

About Milton Ohring (Stevens Institute of Technology, Hoboken, NJ, USA (Retired))

Table of Contents

Additional information

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