Name: Reliability and Degradation of III-V Optical Devices By Osamu Ueda
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Reliability and Degradation of III-V Optical Devices Summary

Reliability and Degradation of III-V Optical Devices by Osamu Ueda

Focusing on helping researchers and engineers involved in III-V compound semiconductor thin film growth and processing, this text shows the mechanism of degradation, detailing the major degradation modes of optical devices fabricated from three different systems, and describing methods for elimination of defect-generating mechanisms.

About Osamu Ueda

Osamu Ueda is a senior researcher at Fujitsu Laboratories Ltd., Japan. He earned his Ph.D. in physical engineering from the University of Tokyo. Dr. Ueda has written more than 100 professional papers and is a member of the Society of Applied Physics, the Society of Electron Microscopy, the Electrochemical Society, and the Materials Research Society.

Introduction. Materials and Structures of Optical Devices: Materials for Optical Devices. Structures of Optical Devices. Crystal Growth: Preparation of Materials by LPE. Preparation of Materials by MOVPE. Preparation of Materials by MBE. Fabrication Processes of Optical Devices: Fabrication Processes. Device Characteristics and Life Testing: Device Characteristics. Life Testing of Devices. Evaluation Techniques for III-V Compound Semiconductors and Degraded Optical Devices: Classification of Evaluation Techniques. Visual Inspection. Chemical Etching. Optical Measurement. Electrical Measurement. Structural Evaluation of Semiconductors by Transmission Electron Microscopy. Analytical Techniques. Flow Chart for Evaluation of Degraded Optical Devices. Materials Issues in III-V Compound Semiconductors I -- Defect Generation: Classification of Defects. Growth-induced Defects. Process-induced defects. Materials Issues in III-V Compound Semiconductors I -- Thermal Stability of III-V Alloy Semiconductors: Composition Modulated Structures. Ordered Structures. Influence of Modulated Structures on the Properties and Reliability of Optical Devices. Classification of Degradation Modes and Degradation Phenomena in Optical Devices: Classification of Degradation Modes in the Life Testing of Lasers and LEDs. Classification of Degradation Phenomena in Lasers. Degradation in LEDs. Influence of Stress on the Device Degradation. Degradation I -- Rapid Degradation: Rapid Degradation in GaAlAs/GaAs Optical Devices. Rapid Degradation in InGaAsP/InP Optical Devices. Rapid Degradation in InGaAsP/InGaP Optical Devices. Comparison of Recombination-enhanced Defect Reaction in Different III-V Materials. Elimination of the Rapid Degradation. Degradation II -- Gradual Degradation: Gradual Degradation in GaAlAs DH LEDs. Gradual Degradation in InGaAsP/InP DH LEDs. Comparison of Gradual Degradation in GaAlAs/GaAs and In GaAsP/InP Optical Devices. Enhancement of Gradual Degradation by Internal Stress in GaAlAs Visible Lasers. Degradation III -- Catastrophic Failure: Catastrophic Failure in Lasers. Catastrophic Failure in LEDs. Elimination of Catastrophic Failure.

Additional information

Sku

NPB9780890066522

ISBN 13

9780890066522

ISBN 10

0890066523

Title

Reliability and Degradation of III-V Optical Devices by Osamu Ueda

Author

Osamu Ueda

Series

Solid State Technology & Devices Library

Condition

New

Binding type

Hardback

Publisher

Artech House Publishers

Year published

1996-09-30

Number of pages

372

Prizes

N/A

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Book picture is for illustrative purposes only, actual binding, cover or edition may vary.

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Reliability and Degradation of III-V Optical Devices Osamu Ueda

Reliability and Degradation of III-V Optical Devices by Osamu Ueda

Summary

Reliability and Degradation of III-V Optical Devices Summary

Reliability and Degradation of III-V Optical Devices by Osamu Ueda

About Osamu Ueda

Table of Contents

Additional information

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