Advances in Imaging and Electron Physics: Volume 116 by Peter W. Hawkes (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France)
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.