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Wire Bonding in Microelectronics: Materials, Processes, Reliability, and Yield George Harman

Wire Bonding in Microelectronics: Materials, Processes, Reliability, and Yield By George Harman

Wire Bonding in Microelectronics: Materials, Processes, Reliability, and Yield by George Harman


$76.97
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Summary

Wire bonds are used to interconnect integrated circuits, multichip modules and hybrids, and microwave as well as power devices to their packages. This is a reference on wire bonding. It emphasis on fine pitch bonding, bonding to MCMs, and additional areas.

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Wire Bonding in Microelectronics: Materials, Processes, Reliability, and Yield Summary

Wire Bonding in Microelectronics: Materials, Processes, Reliability, and Yield by George Harman

This is the classic reference on wire bonding - expanded and updated! "Wire Bonding in Microelectronics Second Edition" the definitive single-volume reference on wire bonding just got better - in an extensively updated edition with over 100 new pages on new materials, new interconnect techniques such as fine pitch wire bonding, and evaluating the pros and cons of alternative bonding technologies. Wire bonds are used to interconnect integrated circuits, multichip modules and hybrids, and microwave as well as power devices to their packages. The book explains it all, with special emphasis on fine pitch bonding, bonding to MCMs, and additional areas that have been developed since the first edition was published.Readers will learn to: understand the bonding technology; test wire bonds; make reliable bonds at a very high yield; bond wires to multichip modules; solve common bonding problems; evaluate alternative bonding technologies; and, improve bondability and reliability via more effective cleaning techniques.

About George Harman

McGraw-Hill authors represent the leading experts in their fields and are dedicated to improving the lives, careers, and interests of readers worldwide

Table of Contents

Technical Introduction to the Second Edition.Ultrasonic Bonding Systems and Technologies (Including Ultrasonic Wire Bonding Mechanism).Some Aspects of Bonding Wire Characteristics That can Affect Bonding, Reliability, or Testing.Wire Bond Testing.Gold-Aluminum Intermetallic Compounds and Other Metallic Interface Reactions Encountered in Wire Bonding.Bond Failures Resulting from Gold-Plating Impurities and Conditions.Cleaning to Improve Bondability and Reliability.Mechanical Problems in Wire Bonding.High-Yield and Fine-Pitch Wire Bonding.Wire Bonding to Multichip Modules and Other Soft Substrates.Glossary.Index.

Additional information

CIN0070326193VG
9780070326194
0070326193
Wire Bonding in Microelectronics: Materials, Processes, Reliability, and Yield by George Harman
Used - Very Good
Hardback
McGraw-Hill Education - Europe
1997-06-22
290
N/A
Book picture is for illustrative purposes only, actual binding, cover or edition may vary.
This is a used book - there is no escaping the fact it has been read by someone else and it will show signs of wear and previous use. Overall we expect it to be in very good condition, but if you are not entirely satisfied please get in touch with us

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