Preface. I: Noise Sources. l/fNoise Sources; F.N. Hooge. Noise Sources in GaN/AlGaN Quantum Wells and Devices; S. Rumyantsev. l/fNoise in Nanomaterials and Nanostructures: Old Questions in a New Fashion; M.N. Mihaila. l/fSpectra as a Consequence of the Randomness of Variance; G. Hartler. Quantum Phase Locking, l/fNoise and Entanglement; M. Planat, H. Rosu. Shot Noise in Mesoscopic Devices and Quantum Dot Networks; P. Maccuci, et al. Super-Poissonian Noise in Nanostructures; Y. Blanter. Stochastic and Deterministic Models of Noise; J. Kumicak. II: Noise in Nanoscale Devices. Noise in Optoelectric Devices; R. Alabedra. Fluctuations of Optical and Electrical Parameters and Their Correlation of Multiple-Quantum-Well INGAAS/INP Lasers; S. Pralgauskaite, et al. Microwave Noise and Fast/Ultrafast Electronic Processes in Nitride 2DEG Channels; A. Matulionis. Noise of High Temperature Superconducting Bolometers; I.A. Khrebtov. l/fNoise in MOSTs: Faster is Noisier; L.K.J. Vandamme. Experimental Assessment of Quantum Effects in the Low-Frequency Noise and RTS of Deep Submicron MOSFETs; I. Simoen, et al. Noise and Tunneling through the 2.5 nm Gate Oxide in SOI MOSFETs; N. Lukyanchikova, et al. Low Frequency Noise Studies of Si Nano-Crystal Effects in MOS Transistors and Capacitors; S. Ferraton, et al. Noise Modelling in Low Dimensional Electronic Structures; L. Reggiani, et al. Correlation Noise Measurements and Modelling of Nanoscale MOSFETs; J. Lee, G. Bosman. Tunneling Effects and Low Frequency Noise of GaN/GaAlN HFETs; M. Levinshtein, et al. High Frequency Noise Sources Extraction in Nanometique MOSFETs; F. Danneville, etal. Informative 'Passport Data' of Surface Nano- and Microstructures; S.F. Timashev, et al. III: Noise Measurement Technique. Noise Measurement Techniques; L.K.J. Vandamme. Techniques for High-Sensitivity Measurements of Shot Noise in Nanostructures; B. Pellegrini, et al. Correlation Spectrum Analyser: Principles and Limits in Noise Measurements; G. Ferrari, M. Sampietro. Measurement and Analysis Methods for Random Telegraph Signals; Z. Celik-Butler. RTS in Quantum Dots and MOSFETs: Set-Up with Long-Time Stability and Magnetic Fields Compensation; J. Sikula, et al. Some Considerations for the Construction of Low-Noise Amplifiers in Very Low Frequency Region; J. Sikula, et al. Measurements of Low Frequency Noise in Nano-Grained RuO2+Glass Films below 1 K; A. Kolek. Technique for Investigation of Non-Gaussian and Non-Stationary Properties of LF Noise in Nanoscale Semiconductor Devices; A. Yakimov, et al. The Noise Background Suppression of Noise Measuring Set-Ups; P. Hruska, K. Hajek. Accuracy of Noise Measurements for l/f and GR Noise; I. Slaidiņs. Radiofrequency and Microwave Noise Metrology; E. Rubioloa, V. Giordano. Treatment of Noise Data in Laplace Plane; B.M. Grafov. Measurement of Noise Parameter Set in the Low Frequency Range: Requirements and Instrumentation; L. Hasse. Techniques of Interference Reduction in Probe System for Wafer Noise Measurements of Submicron Semiconductor Devices; L. Spiralski, et al. Hooge Mobility Fluctuations in n-Insb Magnetoresistors as a Reference for Access Resistance LF-Noise Measurements of SiGe Metamorphic HMOS FETs; S. Durov, et al. Optimised Preamplifier for LF-Noise MOSFET Characterization; S. Durov, O.A. Mironov. Net of
