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Electronics Reliability and Measurement Technology Joseph S. Heyman

Electronics Reliability and Measurement Technology By Joseph S. Heyman

Electronics Reliability and Measurement Technology by Joseph S. Heyman


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Summary

Examines electronics reliability and measurement technology. This book identifies advances in measurement science and technology for nondestructive evaluation, and details common measurement trouble spots.

Electronics Reliability and Measurement Technology Summary

Electronics Reliability and Measurement Technology: Nondestructive Evaluation by Joseph S. Heyman

This book examines electronics reliability and measurement technology. It identifies advances in measurement science and technology for nondestructive evaluation, and it details common measurement trouble spots.

Table of Contents

Measurement Science and Manufacturing Science ResearchNondestructive SEM for Surface and Subsurface Wafer ImagingSurface Inspection-Research and DevelopmentWafer Level Reliability for High-Performance VLSI DesignWafer Level Reliability Testing: an Idea Whose Time Has ComeMicro-Focus X-Ray ImagingMeasurement of Opaque Film ThicknessIntelligent Laser Soldering Inspection and Process ControlRupture Testing for the Quality Control of Electrodeposited Copper Interconnections in High-Speed, High-Density CircuitsHeterodyne Holographic Interferometry: High-Resolution Ranging and Displacement MeasurementWhole Wafer Scanning Electron Microscopy

Additional information

NPB9780815511717
9780815511717
081551171X
Electronics Reliability and Measurement Technology: Nondestructive Evaluation by Joseph S. Heyman
New
Hardback
William Andrew Publishing
1998-12-31
140
N/A
Book picture is for illustrative purposes only, actual binding, cover or edition may vary.
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