Cart
Free US shipping over $10
Proud to be B-Corp

Unified Methods for VLSI Simulation and Test Generation Kwang-Ting (Tim) Cheng

Unified Methods for VLSI Simulation and Test Generation By Kwang-Ting (Tim) Cheng

Unified Methods for VLSI Simulation and Test Generation by Kwang-Ting (Tim) Cheng


Unified Methods for VLSI Simulation and Test Generation Summary

Unified Methods for VLSI Simulation and Test Generation by Kwang-Ting (Tim) Cheng

Unfortunately we do not have a summary for this item at the moment

Additional information

NPB9780792390251
9780792390251
0792390253
Unified Methods for VLSI Simulation and Test Generation by Kwang-Ting (Tim) Cheng
New
Hardback
Springer
1989-06-30
148
N/A
Book picture is for illustrative purposes only, actual binding, cover or edition may vary.
This is a new book - be the first to read this copy. With untouched pages and a perfect binding, your brand new copy is ready to be opened for the first time

Customer Reviews - Unified Methods for VLSI Simulation and Test Generation