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Intellectual Property Damages Mark A. Glick (University of Utah, UT)

Intellectual Property Damages By Mark A. Glick (University of Utah, UT)

Intellectual Property Damages by Mark A. Glick (University of Utah, UT)


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Summary

This book presents the basics of the Intellectual Property litigation process, the essential rules in postulating damages theories, the basics of IP law, the economic policies that are the foundation for much of IP litigation, and the skills necessary to correctly calculate damages in IP cases.

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Intellectual Property Damages Summary

Intellectual Property Damages: Guidelines and Analysis by Mark A. Glick (University of Utah, UT)

A comprehensive resource for anyone involved in intellectual property litigation

With Intellectual Property Damages you'll get the basics of the intellectual property litigation process, the essential rules in postulating damages theories, the basics of IP law, the economic policies that are the foundation for much of IP litigation, the skills necessary to correctly calculate damages in IP cases--and more!

Order your copy today!

About Mark A. Glick (University of Utah, UT)

Mark Glick, JD, PhD is a professor of economics at the University of Utah where he teaches industrial organization, antitrust economics and law and economics. He has also taught antitrust law and regulated industries in the College of Law. Glick has over 15 years of experience in law and economics issues and litigation. He has been involved in numerous cases as a consultant, attorney and/or expert involving regulated antitrust, intellectual property damages, and commercial damages.

Lara A. Reymann, JD is an attorney with Parsons Behle Latimer, Salt Lake City UT whose practice focuses on intellectual property litigation. She is a member of the American Bar Association's Intellectual Property Law Section and Litigation Section. She has been a pressnter on the topic of IP damages at several conferences and seminars.

Table of Contents

Preface.

Introduction by Robert Goldscheider.

PART ONE: LEGAL, ECONOMIC, AND FINANCIAL FOUNDATIONS OF INTELLECTUAL PROPERTY DAMAGES.

Chapter 1. The Litigation Process.

Chapter 2. Damage Principles and Daubert.

Chapter 3. Introduction to the Economics of Intellectual Property Damage Calculations.

Chapter 4. Introduction to Accounting Principles in Intellectual Property Damages.

Chapter 5. Financial Principles Used in Intellectual Property Damages.

PART TWO: PATENT INFRINGEMENT DAMAGES.

Chapter 6. Introduction to Patent Law.

Chapter 7. How to Calculate Patent Damages.

Chapter 8. Introduction to the Antitrust Laws.

Chapter 9. The Intellectual Property-Antitrust Interface.

PART THREE: COPYRIGHT, TRADEMARK, AND TRADE SECRET DAMAGES.

Chapter 10. Introduction to Copyright Law.

Chapter 11. Introduction to Trademark Law and Trade Secret Law.

Chapter 12. Misuse of Copyrights, Trademarks, and Trade Secrets.

Chapter 13. How to Calculate Copyright, Trademark, and Trade Secret Damages.

Chap ter 14. The Nuts and Bolts of Intellectual Property Damage Calculation.

PART FOUR: APPENDICES.

Appendix A: Sample Requests for Production of Documents and Interrogatories.

Appendix B: Sample Expert Report of John Smith.

Appendix C: Antitrust Guidelines for the Licensing of Intellectual Property.

Appendix D: Sample Patent.

Appendix E: United States Code (U.S.C.) Title 35-Patents.

Appendix F: Copyright Act of 1976.

Appendix G: Trademark Act of 1946 (Lanham Act), as Amended.

Appendix H: Uniform Trade Secrets Act with 1985 Amendments.

Appendix I: Restatement of the Law, 3rd, Unfair Competition.

Index.

Additional information

CIN0471237191G
9780471237198
0471237191
Intellectual Property Damages: Guidelines and Analysis by Mark A. Glick (University of Utah, UT)
Used - Good
Hardback
John Wiley & Sons Inc
20021128
504
N/A
Book picture is for illustrative purposes only, actual binding, cover or edition may vary.
This is a used book - there is no escaping the fact it has been read by someone else and it will show signs of wear and previous use. Overall we expect it to be in good condition, but if you are not entirely satisfied please get in touch with us

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