Name: Advances in Imaging and Electron Physics Including Proceedings CPO-10 By Peter W. Hawkes (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France)
SKU: 9780128174753
Price: 295.69 USD
Availability: InStock

Advances in Imaging and Electron Physics Including Proceedings CPO-10 Summary

Advances in Imaging and Electron Physics Including Proceedings CPO-10: Volume 212 by Peter W. Hawkes (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France)

Advances in Imaging and Electron Physics, Volume 212, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

About Peter W. Hawkes (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France)

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics. Dr Martin Hytch, serial editor for the book series Advances in Imaging and Electron Physics (AIEP), is a senior scientist at the French National Centre for Research (CNRS) in Toulouse. He moved to France after receiving his PhD from the University of Cambridge in 1991 on Quantitative high-resolution transmission electron microscopy (HRTEM), joining the CNRS in Paris as permanent staff member in 1995. His research focuses on the development of quantitative electron microscopy techniques for materials science applications. He is notably the inventor of Geometric Phase Analysis (GPA) and Dark-Field Electron Holography (DFEH), two techniques for the measurement of strain at the nanoscale. Since moving to the CEMES-CNRS in Toulouse in 2004, he has been working on aberration-corrected HRTEM and electron holography for the study of electronic devices, nanocrystals and ferroelectrics. He was laureate of the prestigious European Microscopy Award for Physical Sciences of the European Microscopy Society in 2008. To date he has published 130 papers in international journals, filed 6 patents and has given over 70 invited talks at international conferences and workshops.

Part I. Papers from the Tenth International Conference on Charged Particle Optics 1. Planar multi-reflecting time-of-flight mass-spectrometer of a simple design Seitkerim B. Bimurzaev 2. Generalization of paraxial trajectory method for the analysis of non-paraxial rays Shin Fujita 3. Test and characterization of a new post-column imaging energy filter Frank Kahl, Volker Gerheim, Martin Linck, Heiko Muller, Richard Schillinger, Stephan Uhlemann 4. Electron optics for a multi-pass transmission electron microscope Marian Mankos, Stewart A. Koppell, Brannon B. Klopfer, Thomas Juffmann, Vladimir Kolarik, Khashayar Shadman, Mark Kasevich 5. A simulation program for electron mirrors using Boundary Element Method Eric Munro, Haoning Liu, Catherine Rouse, John Rouse 6. An algorithm for simulating the geometric optics of charged particle instruments Khashayar Shadman Part II. The Nano-aperture Ion Source 7. Introduction to focused ion beams, ion sources, and the nano-aperture ion source Leon van Kouwen 8. Nano-fluidic flow in the nano-aperture ion source Leon van Kouwen 9. Optics of ion emission from the nano-aperture ion source Leon van Kouwen 10. A model for ion-neutral scattering in the nano-aperture source Leon van Kouwen 11. Ion emission simulations of the nano-aperture ion source Leon van Kouwen 12. Processes in the ionization volume of the nano-aperture ion source Leon van Kouwen

Additional information

Sku

NPB9780128174753

ISBN 13

9780128174753

ISBN 10

0128174757

Title

Advances in Imaging and Electron Physics Including Proceedings CPO-10: Volume 212 by Peter W. Hawkes (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France)

Author

Peter W. Hawkes (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France)

Condition

New

Binding type

Hardback

Publisher

Elsevier Science Publishing Co Inc

Year published

2019-10-15

Number of pages

376

Prizes

N/A

Cover note

Book picture is for illustrative purposes only, actual binding, cover or edition may vary.

Note

This is a new book - be the first to read this copy. With untouched pages and a perfect binding, your brand new copy is ready to be opened for the first time

Advances in Imaging and Electron Physics Including Proceedings CPO-10 Summary

About Peter W. Hawkes (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France)

Table of Contents

Additional information

Customer Reviews - Advances in Imaging and Electron Physics Including Proceedings CPO-10