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Digital Noise Monitoring of Defect Origin Telman Aliev

Digital Noise Monitoring of Defect Origin By Telman Aliev

Digital Noise Monitoring of Defect Origin by Telman Aliev


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Summary

This book explores the initial stage of the origin of the defect taking into account technical, biological, and other features of several technologies. These technologies allow the defect monitoring at the beginning of the defect origin to be performed at the expense of extracting information from the noise.

Digital Noise Monitoring of Defect Origin Summary

Digital Noise Monitoring of Defect Origin by Telman Aliev

This book explores the initial stage of the origin of the defect taking into account technical, biological, and other features of several technologies. These technologies allow the defect monitoring at the beginning of the defect origin to be performed at the expense of extracting information from the noise. This book appeals to a wide audience focused on solving numerous problems.

Digital Noise Monitoring of Defect Origin Reviews

From the reviews:

The monograph builds on a long series of publications by the author over the last decade. ... monograph should benefit researchers and practicing engineers ... particularly those in search of new application tools in quality engineering applied in a broad setting. ... In summary this monograph is undoubtedly going to be a valuable research tool in the hands of an applied scientist, an engineer and a quality reliability engineer in industry. (Sailes K. Sengupta, Technometrics, Vol. 53 (1), February, 2011)

Table of Contents

Difficulties of Monitoring a Defect at Its Origin and Its Dataware Features.- Position-Binary Technology of Monitoring Defect at its Origin.- Technology of Digital Analysis of Noise as a Carrier of Information about the Beginning of a Defect's Origin.- Robust Correlation Monitoring of a Defect at its Origin.- Spectral Monitoring of a Defect's Origin.- The Digital Technology of Forecasting Failures by Considering Noise as a Data Carrier.- The Technology of Monitoring a Defect's Origin by Considering Noise as a Data Carrier.

Additional information

NLS9781441944108
9781441944108
1441944109
Digital Noise Monitoring of Defect Origin by Telman Aliev
New
Paperback
Springer-Verlag New York Inc.
2010-11-24
224
N/A
Book picture is for illustrative purposes only, actual binding, cover or edition may vary.
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Customer Reviews - Digital Noise Monitoring of Defect Origin