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Frontiers in Electronic Testing Books
Frontiers in Electronic Testing Books
1
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Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
by M. Bushnell
New
$177.79
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The Core Test Wrapper Handbook
by Francisco da Silva
New
$199.49
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Introduction to Advanced System-on-Chip Test Design and Optimization
by Erik Larsson
New
$175.59
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Formal Equivalence Checking and Design Debugging
by Shi-Yu Huang
New
$249.09
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Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
by M. Bushnell
New
$153.19
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Fault Diagnosis of Analog Integrated Circuits
by Prithviraj Kabisatpathy
Very Good
$10.68
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Design for AT-Speed Test, Diagnosis and Measurement
by Benoit Nadeau-Dostie
New
$204.89
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Multi-Chip Module Test Strategies
by Yervant Zorian
New
$143.19
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Advances in Electronic Testing
by Dimitris Gizopoulos
New
$282.59
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Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation
by Alfredo Benso
New
$148.89
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Exit Wounds
by John Westermann
Good
$7.34
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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
by Manoj Sachdev
New
$273.59
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High Performance Memory Testing
by R. Dean Adams
New
$148.59
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Data Mining and Diagnosing IC Fails
by Leendert M. Huisman
Good
$104.55
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From Contamination to Defects, Faults and Yield Loss
by Jitendra B. Khare
New
$142.89
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Efficient Branch and Bound Search with Application to Computer-Aided Design
by Xinghao Chen
New
$141.89
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Reasoning in Boolean Networks
by Wolfgang Kunz
New
$203.99
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Fault-Tolerance Techniques for SRAM-Based FPGAs
by Fernanda Lima Kastensmidt
New
$148.89
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Formal Equivalence Checking and Design Debugging
by Shi-Yu Huang
New
$148.59
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Design for AT-Speed Test, Diagnosis and Measurement
by Benoit Nadeau-Dostie
New
$149.09
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Data Mining and Diagnosing IC Fails
by Leendert M. Huisman
New
$148.89
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Research Perspectives and Case Studies in System Test and Diagnosis
by John W. Sheppard
New
$203.79
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Delay Fault Testing for VLSI Circuits
by Angela Krstic
New
$203.69
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Elements of STIL
by Gregory A. Maston
New
$148.99
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Emerging Nanotechnologies
by Mohammad Tehranipoor
New
$240.29
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Test Resource Partitioning for System-on-a-Chip
by Vikram Iyengar
New
$122.69
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Digital Timing Measurements
by Wolfgang Maichen
New
$148.89
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Soft Errors in Modern Electronic Systems
by Michael Nicolaidis
New
$212.19
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On-Line Testing for VLSI
by Michael Nicolaidis
New
$135.79
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The Core Test Wrapper Handbook
by Francisco da Silva
New
$127.99
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Research Perspectives and Case Studies in System Test and Diagnosis
by John W. Sheppard
New
$148.49
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Emerging Nanotechnologies
by Mohammad Tehranipoor
New
$199.99
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Digital Timing Measurements
by Wolfgang Maichen
New
$198.49
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Testability Concepts for Digital ICs
by F.P.M. Beenker
New
$203.69
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Analog and Mixed-Signal Boundary-Scan
by Adam Osseiran
New
$203.29
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From Contamination to Defects, Faults and Yield Loss
by Jitendra B. Khare
New
$122.09
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Add to cart
Fault-Tolerance Techniques for SRAM-Based FPGAs
by Fernanda Lima Kastensmidt
New
$142.99
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Add to cart
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
by Manoj Sachdev
New
$175.09
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Fault Diagnosis of Analog Integrated Circuits
by Prithviraj Kabisatpathy
New
$135.89
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A Designer's Guide to Built-In Self-Test
by Charles E. Stroud
New
$213.89
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Introduction to IDDQ Testing
by S. Chakravarty
New
$143.29
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Advances in Electronic Testing
by Dimitris Gizopoulos
New
$175.79
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Testability Concepts for Digital ICs
by F.P.M. Beenker
New
$148.89
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Analog and Mixed-Signal Boundary-Scan
by Adam Osseiran
New
$187.59
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On-Line Testing for VLSI
by Michael Nicolaidis
New
$142.99
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Boundary-Scan Interconnect Diagnosis
by Jose T. de Sousa
New
$203.49
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Delay Fault Testing for VLSI Circuits
by Angela Krstic
New
$148.19
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Efficient Branch and Bound Search with Application to Computer-Aided Design
by Xinghao Chen
New
$134.99
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