My Account
Log in Registration
All
Cart
Highlights
Fiction Books
Non-Fiction Books
Children's Books
Rare Books
Music
DVD & Blu-Ray
Video Games
Category
Wishlists
Cart
All
Free US shipping over $10
Trustpilot
Proud to be B-Corp

Frontiers in Electronic Testing Books

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits By M. Bushnell
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuitsby M. Bushnell
New
$177.79
The Core Test Wrapper Handbook By Francisco da Silva
The Core Test Wrapper Handbookby Francisco da Silva
New
$199.49
Introduction to Advanced System-on-Chip Test Design and Optimization By Erik Larsson
Introduction to Advanced System-on-Chip Test Design and Optimizationby Erik Larsson
New
$175.59
Formal Equivalence Checking and Design Debugging By Shi-Yu Huang
Formal Equivalence Checking and Design Debuggingby Shi-Yu Huang
New
$249.09
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits By M. Bushnell
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuitsby M. Bushnell
New
$153.19
Fault Diagnosis of Analog Integrated Circuits By Prithviraj Kabisatpathy
Fault Diagnosis of Analog Integrated Circuitsby Prithviraj Kabisatpathy
Very Good
$10.68
Faster Shipping
Design for AT-Speed Test, Diagnosis and Measurement By Benoit Nadeau-Dostie
Design for AT-Speed Test, Diagnosis and Measurementby Benoit Nadeau-Dostie
New
$204.89
Multi-Chip Module Test Strategies By Yervant Zorian
Multi-Chip Module Test Strategiesby Yervant Zorian
New
$143.19
Advances in Electronic Testing By Dimitris Gizopoulos
Advances in Electronic Testingby Dimitris Gizopoulos
New
$282.59
Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation By Alfredo Benso
Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluationby Alfredo Benso
New
$148.89
Exit Wounds By John Westermann
Exit Woundsby John Westermann
Good
$7.34
Faster Shipping
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits By Manoj Sachdev
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuitsby Manoj Sachdev
New
$273.59
High Performance Memory Testing By R. Dean Adams
High Performance Memory Testingby R. Dean Adams
New
$148.59
Data Mining and Diagnosing IC Fails By Leendert M. Huisman
Data Mining and Diagnosing IC Failsby Leendert M. Huisman
Good
$104.55
Faster Shipping
From Contamination to Defects, Faults and Yield Loss By Jitendra B. Khare
From Contamination to Defects, Faults and Yield Lossby Jitendra B. Khare
New
$142.89
Efficient Branch and Bound Search with Application to Computer-Aided Design By Xinghao Chen
Efficient Branch and Bound Search with Application to Computer-Aided Designby Xinghao Chen
New
$141.89
Reasoning in Boolean Networks By Wolfgang Kunz
Reasoning in Boolean Networksby Wolfgang Kunz
New
$203.99
Fault-Tolerance Techniques for SRAM-Based FPGAs By Fernanda Lima Kastensmidt
Fault-Tolerance Techniques for SRAM-Based FPGAsby Fernanda Lima Kastensmidt
New
$148.89
Formal Equivalence Checking and Design Debugging By Shi-Yu Huang
Formal Equivalence Checking and Design Debuggingby Shi-Yu Huang
New
$148.59
Design for AT-Speed Test, Diagnosis and Measurement By Benoit Nadeau-Dostie
Design for AT-Speed Test, Diagnosis and Measurementby Benoit Nadeau-Dostie
New
$149.09
Data Mining and Diagnosing IC Fails By Leendert M. Huisman
Data Mining and Diagnosing IC Failsby Leendert M. Huisman
New
$148.89
Research Perspectives and Case Studies in System Test and Diagnosis By John W. Sheppard
Research Perspectives and Case Studies in System Test and Diagnosisby John W. Sheppard
New
$203.79
Delay Fault Testing for VLSI Circuits By Angela Krstic
Delay Fault Testing for VLSI Circuitsby Angela Krstic
New
$203.69
Elements of STIL By Gregory A. Maston
Elements of STILby Gregory A. Maston
New
$148.99
Emerging Nanotechnologies By Mohammad Tehranipoor
Emerging Nanotechnologiesby Mohammad Tehranipoor
New
$240.29
Test Resource Partitioning for System-on-a-Chip By Vikram Iyengar
Test Resource Partitioning for System-on-a-Chipby Vikram Iyengar
New
$122.69
Digital Timing Measurements By Wolfgang Maichen
Digital Timing Measurementsby Wolfgang Maichen
New
$148.89
Soft Errors in Modern Electronic Systems By Michael Nicolaidis
Soft Errors in Modern Electronic Systemsby Michael Nicolaidis
New
$212.19
On-Line Testing for VLSI By Michael Nicolaidis
On-Line Testing for VLSIby Michael Nicolaidis
New
$135.79
The Core Test Wrapper Handbook By Francisco da Silva
The Core Test Wrapper Handbookby Francisco da Silva
New
$127.99
Research Perspectives and Case Studies in System Test and Diagnosis By John W. Sheppard
Research Perspectives and Case Studies in System Test and Diagnosisby John W. Sheppard
New
$148.49
Emerging Nanotechnologies By Mohammad Tehranipoor
Emerging Nanotechnologiesby Mohammad Tehranipoor
New
$199.99
Digital Timing Measurements By Wolfgang Maichen
Digital Timing Measurementsby Wolfgang Maichen
New
$198.49
Testability Concepts for Digital ICs By F.P.M. Beenker
Testability Concepts for Digital ICsby F.P.M. Beenker
New
$203.69
Analog and Mixed-Signal Boundary-Scan By Adam Osseiran
Analog and Mixed-Signal Boundary-Scanby Adam Osseiran
New
$203.29
From Contamination to Defects, Faults and Yield Loss By Jitendra B. Khare
From Contamination to Defects, Faults and Yield Lossby Jitendra B. Khare
New
$122.09
Fault-Tolerance Techniques for SRAM-Based FPGAs By Fernanda Lima Kastensmidt
Fault-Tolerance Techniques for SRAM-Based FPGAsby Fernanda Lima Kastensmidt
New
$142.99
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits By Manoj Sachdev
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuitsby Manoj Sachdev
New
$175.09
Fault Diagnosis of Analog Integrated Circuits By Prithviraj Kabisatpathy
Fault Diagnosis of Analog Integrated Circuitsby Prithviraj Kabisatpathy
New
$135.89
A Designer's Guide to Built-In Self-Test By Charles E. Stroud
A Designer's Guide to Built-In Self-Testby Charles E. Stroud
New
$213.89
Introduction to IDDQ Testing By S. Chakravarty
Introduction to IDDQ Testingby S. Chakravarty
New
$143.29
Advances in Electronic Testing By Dimitris Gizopoulos
Advances in Electronic Testingby Dimitris Gizopoulos
New
$175.79
Testability Concepts for Digital ICs By F.P.M. Beenker
Testability Concepts for Digital ICsby F.P.M. Beenker
New
$148.89
Analog and Mixed-Signal Boundary-Scan By Adam Osseiran
Analog and Mixed-Signal Boundary-Scanby Adam Osseiran
New
$187.59
On-Line Testing for VLSI By Michael Nicolaidis
On-Line Testing for VLSIby Michael Nicolaidis
New
$142.99
Boundary-Scan Interconnect Diagnosis By Jose T. de Sousa
Boundary-Scan Interconnect Diagnosisby Jose T. de Sousa
New
$203.49
Delay Fault Testing for VLSI Circuits By Angela Krstic
Delay Fault Testing for VLSI Circuitsby Angela Krstic
New
$148.19
Efficient Branch and Bound Search with Application to Computer-Aided Design By Xinghao Chen
Efficient Branch and Bound Search with Application to Computer-Aided Designby Xinghao Chen
New
$134.99