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Frontiers in Electronic Testing Books

The Core Test Wrapper Handbook By Francisco da Silva
The Core Test Wrapper Handbookby Francisco da Silva
New
$199.49
Multi-Chip Module Test Strategies By Yervant Zorian
Multi-Chip Module Test Strategiesby Yervant Zorian
New
$143.19
Advances in Electronic Testing By Dimitris Gizopoulos
Advances in Electronic Testingby Dimitris Gizopoulos
New
$282.59
Exit Wounds By John Westermann
Exit Woundsby John Westermann
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$7.34
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High Performance Memory Testing By R. Dean Adams
High Performance Memory Testingby R. Dean Adams
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$148.59
Data Mining and Diagnosing IC Fails By Leendert M. Huisman
Data Mining and Diagnosing IC Failsby Leendert M. Huisman
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$104.55
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Reasoning in Boolean Networks By Wolfgang Kunz
Reasoning in Boolean Networksby Wolfgang Kunz
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$203.99
Data Mining and Diagnosing IC Fails By Leendert M. Huisman
Data Mining and Diagnosing IC Failsby Leendert M. Huisman
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$148.89
Delay Fault Testing for VLSI Circuits By Angela Krstic
Delay Fault Testing for VLSI Circuitsby Angela Krstic
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$203.69
Elements of STIL By Gregory A. Maston
Elements of STILby Gregory A. Maston
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$148.99
Emerging Nanotechnologies By Mohammad Tehranipoor
Emerging Nanotechnologiesby Mohammad Tehranipoor
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$240.29
Digital Timing Measurements By Wolfgang Maichen
Digital Timing Measurementsby Wolfgang Maichen
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$148.89
On-Line Testing for VLSI By Michael Nicolaidis
On-Line Testing for VLSIby Michael Nicolaidis
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$135.79
The Core Test Wrapper Handbook By Francisco da Silva
The Core Test Wrapper Handbookby Francisco da Silva
New
$127.99
Emerging Nanotechnologies By Mohammad Tehranipoor
Emerging Nanotechnologiesby Mohammad Tehranipoor
New
$199.99
Digital Timing Measurements By Wolfgang Maichen
Digital Timing Measurementsby Wolfgang Maichen
New
$198.49
Testability Concepts for Digital ICs By F.P.M. Beenker
Testability Concepts for Digital ICsby F.P.M. Beenker
New
$203.69
Analog and Mixed-Signal Boundary-Scan By Adam Osseiran
Analog and Mixed-Signal Boundary-Scanby Adam Osseiran
New
$203.29
Introduction to IDDQ Testing By S. Chakravarty
Introduction to IDDQ Testingby S. Chakravarty
New
$143.29
Advances in Electronic Testing By Dimitris Gizopoulos
Advances in Electronic Testingby Dimitris Gizopoulos
New
$175.79
Testability Concepts for Digital ICs By F.P.M. Beenker
Testability Concepts for Digital ICsby F.P.M. Beenker
New
$148.89
Analog and Mixed-Signal Boundary-Scan By Adam Osseiran
Analog and Mixed-Signal Boundary-Scanby Adam Osseiran
New
$187.59
On-Line Testing for VLSI By Michael Nicolaidis
On-Line Testing for VLSIby Michael Nicolaidis
New
$142.99
Boundary-Scan Interconnect Diagnosis By Jose T. de Sousa
Boundary-Scan Interconnect Diagnosisby Jose T. de Sousa
New
$203.49
Delay Fault Testing for VLSI Circuits By Angela Krstic
Delay Fault Testing for VLSI Circuitsby Angela Krstic
New
$148.19